一种基于参考切片相容的测试数据压缩方法A Method Based on Reference Slice Compatibility for Test Data Compression
吴殿丞,朱浩,王东辉,侯朝焕
摘要(Abstract)：
为了减少集成电路测试数据量,本文提出一种基于参考切片相容的广播式编码压缩方法。以使用两个扫描切片作为参考切片为例介绍了对该编码方法进行了介绍。当测试图形的切片与参考切片直接相容或移位相容时,仅使用3或5比特长度的码字对其编码以实现压缩;提出一种参考切片无关位回溯赋值的方法以保证一致性。针对所提出的编码压缩方案设计了相应的解压缩电路。通过实验数据证实了该方案的有效性。
关键词(KeyWords)： 测试数据压缩;自动测试设备;有限状态机;无关位
基金项目(Foundation):
作者(Author): 吴殿丞,朱浩,王东辉,侯朝焕
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